ASTE Scholarship being presented at NEPCON West 2002
From left to right:
Professor Fabrizio Lombardi; Young Jun Lee; ASTE's
Executive Director, Michael Keller (ASTE Executive Director);
Professor Yong-Bin Kim (Young Jun Lee's Advisor) and Luca Schiano. The
2002 ASTE/NEPCON Test Engineering Scholarship awards (totaling $5000.00)
were madeat the Northeastern University Faculty Club, in Boston, Massachusetts
on the 31st of January 2003.
The 2002 ASTE/NEPCON Test Engineering Scholarship winners are Young
Jun Lee and Luca Schiano, both students of Professor Fabrizio
Lombardi, Chair, and International Test Conference Professor, Department
of Electrical & Computer Engineering, Northeastern University, 309
Dana Research Building, Boston, MA 02115-5000.
The winners submitted the following papers:
1. "Analysis and Measurement of Timing Jitter Introduced by Radiated
EMI Noise in Automatic Test Equipment" by Young Jun Lee, a NU
2. "An On-Line
Testing Solution for Power Supply Noise Detection" by
Luca Schiano, NU Phd candidate.
in conjunction with NEPCON
is proud to award these scholarships to these outstanding doctoral candidates
in the field of test engineering.