$5,000 ASTE Scholarship being presented at NEPCON West 2002

From left to right: Professor Fabrizio Lombardi; Young Jun Lee; ASTE's
Executive Director, Michael Keller (ASTE Executive Director); Professor Yong-Bin Kim (Young Jun Lee's Advisor) and Luca Schiano. The 2002 ASTE/NEPCON Test Engineering Scholarship awards (totaling $5000.00) were madeat the Northeastern University Faculty Club, in Boston, Massachusetts on the 31st of January 2003.

The 2002 ASTE/NEPCON Test Engineering Scholarship winners are Young Jun Lee and Luca Schiano, both students of Professor Fabrizio Lombardi, Chair, and International Test Conference Professor, Department of Electrical & Computer Engineering, Northeastern University, 309 Dana Research Building, Boston, MA 02115-5000.

The winners submitted the following papers:

1. "Analysis and Measurement of Timing Jitter Introduced by Radiated
EMI Noise in Automatic Test Equipment" by Young Jun Lee, a NU Phd candidate.

2. "An On-Line Testing Solution for Power Supply Noise Detection" by
Luca Schiano, NU Phd candidate.

The ASTE in conjunction with NEPCON is proud to award these scholarships to these outstanding doctoral candidates in the field of test engineering.

Congratulations to all.