NEPCON EAST 2002 CALL FOR PAPERS

The IEEE Electro Technical Program committee, in partnership with the American Society of Test Engineers, Inc. (ASTE, www.astetest.org) is looking for high quality technical papers oriented towards an appropriate topic dealing with Test philosophies and strategies in general, and Automatic Test technology in particular. Abstracts for technical papers are now being solicited, as are proposals for the Technical Sessions.

Abstract Deadline: March 15, 2002

Click Here to download the Call for Papers (Microsoft Word document).